June 11 - 14, 2018 | Sheraton Ann Arbor Hotel, Ann Arbor, MI

Prasanth Viswanathan Pillai


Functional Safety Architect
Texas Instruments


16:10 Module F. How to perform an FMEDA on a semiconductor

The accuracy of FMEDA is central to a strong safety case. In this session, you will get a greater understanding of failure modes, effects, and diagnostic coverages. You will learn how to defend engineering judgement used (failure mode distributions, diagnostic coverages, safe faults). You will learn how to use reliability data to extract failure rates.
Co-moderated by Ashish Vanjari, Systems Engineer (Functional Safety), Texas Instruments, USA
And Prasanth Viswanathan Pillai, Functional Safety Architect , Texas Instruments, India

11:20 Applying ISO 26262 in the context of SoC design

Impact of semiconductor failure on application using examples from vehicle traction.      - Deriving semiconductor safety requirements from application.
      - Functional safety metrics.
Semiconductor safety analysis
      - Fault models to be considered
      - Qualitative Analysis (Failure mode analysis and dependent failure analysis)
      - Safety Mechanisms at different levels – Application, device and circuit level
      - Quantitative analysis
Emerging topics in semiconductor safety analysis



Check out the incredible speaker line-up to see who will be joining Prasanth Viswanathan.

Download The Latest Agenda