June 11 - 14, 2018 | Sheraton Ann Arbor Hotel, Ann Arbor, MI

Renaud Gillon

Program Manager
ON Semiconductor

9:40 A framework for analog fault-injection at the behavioral level

A framework is proposed that allows to capture the failure modes of analog circuits for fault-injection simulations, whilst reducing the modeling burden and favoring automation and re-use. The framework relies on impedance transformation wrappers which change the behavior of a fault-free model to map that of specific failure modes. The wrapper-based approach applies to any conservative circuit-block model, whether transistor-level or behavioral. Failure modes can be triggered by setting parameters or using a dedicated signaling bus.

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