June 12 - 14, 2018 | Sheraton Ann Arbor Hotel, Ann Arbor, MI

Agenda Day 2

9:00 - 9:40 How to consider semiconductor components

Evaluating in-context versus SEooC approach for semiconductors
- How does this link to the new ISO 26262-8
clause 13 («Evaluation of HW elements»), including how to handle legacy functions?
- How does ISO 26262-8 clause 13 affect semiconductors, moving forward?
Riccardo Mariani, Intel Fellow, Chief Functional Safety Technologist

9:40 - 10:20 Fault injection for image sensor use in ADAS systems: a case study

• Increase of active safety and automation in road vehicles require image sensors to become compliant with ISO 26262. Safety Measures must now be designed into the image sensors products and development processes in order to meet these new demands
• Integration of functional safety features into the
image sensors delivers key benefits but also represent a real challenge in:
- High coverage to meet ASIL B and ASIL C metrics beyond any practical post-processing techniques.
- Low latency of integrated safety mechanisms
- Unnecessary post-processing to attempt fault discovery through image analysis

11:20 - 12:00 Fault injection for semiconductor – best practices

What is ‘necessary and sufficient’ fault injection for semiconductor as per ISO26262?
Cost vs Benefits of fault injection
               – alternate techniques
Trade-off between ‘Fault Injection’ vs ‘Engineering Judgement’
              – when can we call it done?
Best practices in fault injection for,
               - Accuracy, Completeness, Traceability
Ashish Vanjari, Systems Engineer (Functional Safety), Texas Instruments, USA

12:00 - 12:40 Interactive panel discussion

Steer this discussion with your questions to our panel of experts, and use this unique opportunity to further the conversation on design for safety. As this is a hands-on discussion, come prepared with your questions.

14:00 - 14:40 Expectations & requirements from a SoC developer to IP suppliers

SEooC development process for IP
IP Assumptions of Use & Safety Mechanisms
Configurability of IP safety analysis
Mathieu Blazy-Winning, Automotive Functional Safety Manager, NXP, USA
configurable IPs

14:40 - 15:20 Interactive panel discussion: Optimizing IP integration and reuse

Join the conversation on intellectual property with our experts and address your questions about the use of IP
in the 3rd edition.
Co-moderated by Gus Espinosa, Senior Principal Engineer, Lead Architect for Functional Safety, Intel, USA;Mathieu Blazy-Winning, Automotive Functional Safety Manager, NXP, USA; Antonio Priore, Senior Functional Safety Manager, ARM, UK

15:20 - 16:00 Functional safety considerations in the design of highly configurable IPs

Arm is a global provider of HW and SW generic IPs whose applications span from Mobile to Embedded and Automotive. The presentation  will propose answers to challenges like:
The use of legacy products in the context of functional safety
DIA in the context of highly configurable, general purpose IP
Level of involvement of the IP provider in a distributed development framework
Antonio Priore, Senior Functional Safety Manager, ARM, UK

16:20 - 17:00 Base Failure Rate and SOC Challenges for Functional Safety

Functional Safety (FuSa) and in particular how to
achieve compliance to Soft Error Rate (SER) requirements is an important element to be successful in markets that require functional safety such as drones, robotics and automotive segments. The presentation will cover:
Defining Automotive FuSa SER Requirements
Optimizing AVF to improve Product SER
Combinational SER trends and assessment methodology
Jyotika Athavale, Senior Staff Reliability Architect, Functional Safety, Intel, USA

17:00 - 17:40 Panel discussion: Requests from Tier 1s and OEMs about semiconductor devices

 Our expert line of panelists from Tier Is and OEMs will get together to answer your specific questions about metrics and requirements and address additional topics of your choice.
Co-moderated by Andre Kleyner, Global Reliability Engineering Leader, Aptiv, USAAdnan Haider, Technical Specialist-Electronics, TRW Automotive Electronics, USA
Lisa Clark, Functional Safety Manager, Sensata Technologies, USAScott Wendling, Technical Manager - Safety and Software, Halla Mechatronics, USA

19:00 - 22:30 Evening event

Evening get-together
Enjoy a relaxing get-together with food and drinks for rounding up the first day of the conference. This is an excellent opportunity for you to meet the other attendees and make business contacts.