June 12 - 14, 2018 | Sheraton Ann Arbor Hotel, Ann Arbor, MI

Agenda Day 1

8:30 - 9:30 Module A. Behind the scenes of ISO 26262

Get a deeper understanding of the ISO International Committee structure and the responsibilities of national and international subcommittees. Gain insights into drafting the revision and Publicly Available Specifications. What are the opportunities of getting your voice heard, and getting involved further?
Moderated by Lisa Clark, Functional Safety Manager, Sensata Technologies, USA

9:20 - 10:10 Module B. How to write and structure your requirements

This module is a hands-on training session intended to guide you through writing and structuring reasonable requirements.

10:40 - 11:30 Module C.Setting up a plan

The Functional Safety Management Plan requires specifications as to how functional safety will be
ensured throughout the project and how the targeted ASIL is to be achieved. Get a closer look into role identification, responsibilities and ensure that you are
on the right track from the beginning.

11:30 - 13:30 Trip to University of Michigan campus to visit Mcity Test Facility

14:30 - 15:20 Module D. Overview of how to apply the different parts of ISO 26262 to semiconductors

This module will address the methods to apply the standard specifically to semiconductors. 

15:20 - 16:10 ModulModule E. How to perform an FMEDA on a semiconductor

The accuracy of FMEDA is central to a strong safety case. In this session, you will get a greater understanding of failure modes, effects, and diagnostic coverages. You will learn how to defend engineering judgement used (failure mode distributions, diagnostic coverages, safe faults). You will learn how to use reliability data to extract failure rates.
Co-moderated by Ashish Vanjari, Systems Engineer (Functional Safety), Texas Instruments, USA
And Prasanth Viswanathan Pillai, Functional Safety Architect , Texas Instruments, India

16:30 - 17:20 Module F. Dependent Failure Analysis for semiconductors

Nothing on a single chip is truly independent, so how can you “prove” independence? How do you know how much analysis is enough? Is there a way to quantify this? In this interactive session, there will be the opportunity to cover these questions.
Optimizing AVF to improve Product SER
Combinational SER trends and assessment

18:00 - 20:00 Awards ceremony and evening networking event